Atomic force microscopic study of the microcracking of magnetic thin films under tension

被引：26

作者：

Bobji, MS ^{[1
]}

Bhushan, B ^{[1
]}

机构：

[1] Ohio State Univ, Dept Mech Engn, Comp Microtribol & Contaminat LAb, Columbus, OH 43210 USA

来源：

SCRIPTA MATERIALIA | 2001年 / 44卷 / 01期

关键词：

atomic force microscopy; thin films; mechanical properties;

D O I：

10.1016/S1359-6462(00)00557-1

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The nucleation and growth of microcracks of magnetic thin films were studied using atomic force microscope (AFM). In-situ tensile testing of the magnetic tapes in an AFM was carried out using a custom built stage. The morphologies of the cracks in metal particle (MP) and metal evaporated (ME) magnetic tapes were determined. In the MP tape, a large number of cracks of smaller length was observed, whereas in the ME, the cracks were few in number and extend through out the width of the specimen.

引用

页码：37 / 42

页数：6

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