Comparison of fluorescence properties for single crystal and polycrystalline YAG:Ce

被引:33
作者
Hollerman, WA [1 ]
Allison, SW
Goedeke, SM
Boudreaux, P
Guidry, R
Gates, E
机构
[1] Univ Louisiana, Dept Phys, Lafayette, LA 70504 USA
[2] Oak Ridge Natl Lab, Engn Sci & Technol Div, Oak Ridge, TN 37831 USA
关键词
half brightness dose; phosphors; radiation damage; YAG : Ce;
D O I
10.1109/TNS.2003.814535
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For more than a century, materials that emit visible light when exposed to ionizing radiation, or "fluors," have been used for a variety of scientific and engineering purposes. The Term "half brightness dose" (N-1/2) was developed as a consistent figure of merit to evaluate the effectiveness of a material to emit fluorescence as a function of radiation exposure. Research indicates that certain properties, such as half brightness dose, fluorescence intensity, and prompt decay time, could depend on crystalline structure. The average 3 MeV proton N-1/2 for a polycrystalline YAG:Ce paint was found to be 1.28 x 10(14) mm(-2), which is consistent with earlier research. The 3 MeV proton N-1/2 for the virgin YAG:Ce crystal was found to be 3.1 times larger than was measured for the polycrystalline paint. Subsequent N-1/2 measurements with the crystal were slightly lower than the virgin data and larger than was obtained from the polycrystalline PPMS paint.
引用
收藏
页码:754 / 757
页数:4
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