Photopolymerization by evanescent waves: characterization of photopolymerizable formulation for photolithography with nanometric resolution

被引:14
作者
Espanet, A [1 ]
Dos Santos, G [1 ]
Ecoffet, C [1 ]
Lougnot, DJ [1 ]
机构
[1] ENSCMU, CNRS, UMR 7525, Dept Photochim Gen, F-68093 Mulhouse, France
关键词
thin films; photopolymers; evanescent waves; microparts fabrication; photolithography;
D O I
10.1016/S0169-4332(98)00388-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have recently introduced a photolithography process using photopolymerization by evanescent waves (PEW) which is specially suitable for the fabrication of very thin films and parts of polymers (from few nanometers to 1 mu m). In this work, the response of formulations with various concentrations of amine cosynergist is examined in terms of time/intensity reciprocity. (C) 1999 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:87 / 92
页数:6
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