A high temperature apparatus for measurement of the Seebeck coefficient

被引：260

作者：

Iwanaga, Shiho ^{[1
]}

Toberer, Eric S. ^{[1
]}

LaLonde, Aaron ^{[1
]}

Snyder, G. Jeffrey ^{[1
]}

机构：

[1] CALTECH, Pasadena, CA 91125 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 06期

关键词：

ABSOLUTE SCALE;

D O I：

10.1063/1.3601358

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes. (C) 2011 American Institute of Physics. [doi:10.1063/1.3601358]

引用

页数：6

共 15 条

[1]

Burkov A.T., 1995, Condensed matter: disordered solids, P361

[2]

Burns G. W., 1993, NATL I STANDARDS TEC, V175, P630

[3] High temperature Seebeck coefficient metrology [J].