Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

被引：9

作者：

MacDowell, AA ^{[1
]}

Chang, CH ^{[1
]}

Lamble, GM ^{[1
]}

Celestre, RS ^{[1
]}

Patel, JR ^{[1
]}

Padmore, HA ^{[1
]}

机构：

[1] Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

来源：

X-RAY MICROFOCUSING: APPLICATIONS AND TECHNIQUES | 1998年 / 3449卷

关键词：

x-ray; micro-focusing; x-ray diffraction; x-ray absorption; adaptive optics; bent mirrors; four crystal monochromator;

D O I：

10.1117/12.330341

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4-12keV) from the Advanced Light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. We have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. illumination of the sample with white light allows for elemental mapping and Laue X-ray diffraction, whilst illumination of the sample with monochromatic light allows for elemental mapping (with reduced background), micro-X-ray absorption spectroscopy and micro-diffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.

引用

页码：137 / 144

页数：8