High-accuracy aperture-area measurement facilities at the National Institute of Standards and Technology

被引:28
作者
Fowler, JB [1 ]
Durvasula, RS
Parr, AC
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] Tufts Univ, Medford, MA 02155 USA
关键词
D O I
10.1088/0026-1394/35/4/49
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The uncertainty in the measurement of aperture area can limit high-accuracy radiometric and photometric measurements. Relative total uncertainties in some measurements have now been determined at or below the 0.1% level, making substantially smaller aperture-area measurement uncertainties necessary. The National Institute of Standards and Technology (NIST) has recently implemented an absolute aperture-area measurement facility and a relative aperture-area measurement facility; the two facilities together are designed to determine aperture areas with low uncertainty. The absolute instrument measures the aperture-area using optical edge detection, along with high-precision positioning of the optical edge relative to the sensor, resulting in an expected relative combined standard uncertainty of less than 10(-4). The relative instrument uses optical flux transfer to compare aperture areas and also has an expected relative combined standard uncertainty of less than 10(-4). The absolute instrument will be used to measure the area of standard apertures for use with the relative instrument.
引用
收藏
页码:497 / 500
页数:4
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