Structural, dielectric and electrical properties of NaBa2X5O15 (X = Nb and Ta) ceramics

被引:55
作者
Behera, B [1 ]
Nayak, P
Choudhary, RNP
机构
[1] Sambalpur Univ, PG Dept Phys, Burla 768019, Sambalpur, India
[2] Indian Inst Technol, Dept Phys & Meteorol, Kharagpur 721302, W Bengal, India
关键词
solid-state reaction; TB structure; XRD; microstructure; dielectric; NTCR;
D O I
10.1016/j.matlet.2005.06.019
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polycrystalline samples of NaBa2X5O15 (X=Nb and Ta), i.e., NaBa2Nb5O15 (NBN) and NaBa2Ta5O15 (NBT), members of tungsten bronze family, were prepared using a high-temperature solid-state reaction technique. A preliminary structural (XRD) analysis of these compounds shows the formation of a single-phase orthorhombic structure at room temperature. The scanning electron microscopy (SEM) provides information on the quality of the samples and uniform grain distribution over the surface of the sample. Detailed studies of the dielectric properties suggest that they have undergone a phase transition well above the room temperature. Measurement of electrical conductivity (dc)/resistivity as a function of temperature suggests that compounds have semiconducting properties above the room temperature with negative temperature coefficient of resistance (NTCR) behavior. (C) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:3489 / 3493
页数:5
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