Magnetic resonance force microscopy with a ferromagnetic tip mounted on the force detector

被引:17
作者
Zhang, Z
Hammel, PC
机构
[1] Univ Calif Los Alamos Natl Lab, Condensed Matter & Thermal Phys Grp, Los Alamos, NM 87545 USA
[2] Univ Calif Los Alamos Natl Lab, Ctr Nonlinear Studies, Los Alamos, NM 87545 USA
关键词
magnetic resonance force microscopy; mechanical detection; cantilever; force microscopy; electron spin resonance; nuclear magnetic resonance; ferromagnetic resonance; magnetic resonance imaging;
D O I
10.1016/S0926-2040(97)00097-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The Magnetic Resonance Force Microscope (MRFM) presents the opportunity for a magnetic resonance imaging probe with ultra-high, potentially atomic-scale, resolution. The successful application of this technique in detection of nuclear magnetic, electron-spin and ferromagnetic resonance (FMR) highlights its significant potential. We discuss the capabilities of the MRFM with particular emphasis on the detection of FMR using MRFM techniques. A crucial remaining challenge in the development of the magnetic resonance force microscope (MRFM) is to place the magnetic probe on the mechanical resonator. We address the problem of spurious detector response arising from interactions between the magnetic tip and various external applied fields. We show that miniature, magnetically-polarized Nd2Fe14B particles show promise as magnetic probe tips. Our experience indicates it will be important to minimize the total polarized moment of the magnetic tip and to ensure that the applied fields are as uniform as possible. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:65 / 72
页数:8
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