Small correction required when applying the Hertzian contact model to instrumented indentation data

被引:37
作者
Hay, JL [1 ]
Wolff, PJ [1 ]
机构
[1] MTS Syst Corp, Nano Instruments Innovat Ctr, Oak Ridge, TN 37830 USA
关键词
D O I
10.1557/JMR.2001.0179
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Instrumented indentation testing (IIT) is a relatively new form of mechanical testing which significantly expands on the capabilities of traditional hardness testing. In an IIT experiment, an indenter of known mechanical properties is pressed into contact and then withdrawn from a test material. The fundamental measurements during an IIT experiment are the applied load and the resulting penetration of the indenter into the test surface. The Hertzian contact model, or a derivative thereof, is often employed to relate these measurements to interesting mechanical properties of the test material. This article argues for a small correction to the Hertzian contact model when applied to instrumented indentation data. The magnitude of the correction primarily depends on Poisson's ratio of the test material and the contact radius normalized by the radius of the indenter tip. Neglecting this correction can cause significant errors in the calculation of elastic modulus and hardness from instrumented indentation data.
引用
收藏
页码:1280 / 1286
页数:7
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