HRTEM imaging of atoms at sub-Ångstrom resolution

被引:25
作者
O'Keefe, MA
Allard, LF
Blom, DA
机构
[1] Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
来源
JOURNAL OF ELECTRON MICROSCOPY | 2005年 / 54卷 / 03期
关键词
sub-angstrom ngstrom; atomic-resolution; high-resolution electron microscopy; focal-series reconstruction; exit-surface wave; software aberration correction;
D O I
10.1093/jmicro/dfi036
中图分类号
TH742 [显微镜];
学科分类号
摘要
John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 angstrom resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-angstrom ngstrom levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-angstrom ngstrom imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become commonplace for next-generation electron microscopes with C-S-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the microscope specimen need to be considered. At extreme resolution the 'size' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.
引用
收藏
页码:169 / 180
页数:12
相关论文
共 58 条
[1]  
Allard LF., 2004, MICROSC MICROANAL, V10, P110
[2]   BEAM LATTICE IMAGES .1. EXPERIMENTAL AND COMPUTED IMAGES FROM W4NB26O77 [J].
ALLPRESS, JG ;
HEWAT, EA ;
MOODIE, AF ;
SANDERS, JV .
ACTA CRYSTALLOGRAPHICA SECTION A, 1972, A 28 (NOV1) :528-536
[3]  
ALLPRESS JG, 1969, MAT RES B, V310, P707
[4]  
[Anonymous], 1874, PHILOS MAG, DOI DOI 10.1080/14786447408640996
[5]   NBEAM LATTICE IMAGES .3. UPPER LIMITS OF IONICITY IN W4NB26O77 [J].
ANSTIS, GR ;
LYNCH, DF ;
MOODIE, AF ;
OKEEFE, MA .
ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1) :138-&
[6]   Design and performance of an ultra-high-resolution 300 kV microscope [J].
Bakker, H ;
Bleeker, A ;
Mul, P .
ULTRAMICROSCOPY, 1996, 64 (1-4) :17-34
[7]   Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy [J].
Coene, WMJ ;
Thust, A ;
deBeeck, M ;
VanDyck, D .
ULTRAMICROSCOPY, 1996, 64 (1-4) :109-135
[8]   THE HIGH-RESOLUTION ELECTRON-MICROSCOPY OF STACKING DEFECTS IN CU-ZN-AL SHAPE MEMORY ALLOY [J].
COOK, JM ;
OKEEFE, MA ;
SMITH, DJ ;
STOBBS, WM .
JOURNAL OF MICROSCOPY, 1983, 129 (MAR) :295-306
[9]   ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].
COWLEY, JM ;
IIJMA, S .
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03) :445-+
[10]   FOURIER IMAGES .1. THE POINT SOURCE [J].
COWLEY, JM ;
MOODIE, AF .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05) :486-+