Femtosecond electron diffraction for direct measurement of ultrafast atomic motions

被引：111

作者：

Cao, J ^{[1
]}

Hao, Z

Park, H

Tao, C

Kau, D

Blaszczyk, L

机构：

[1] Florida State Univ, Dept Phys, Tallahassee, FL 32310 USA

[2] Florida State Univ, Natl High Magnet Field Lab, Tallahassee, FL 32310 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 05期

关键词：

D O I：

10.1063/1.1593831

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a femtosecond electron diffraction system capable of directly measuring the complete transient structures with atomic level detail and on 400-fs time scale in solid materials. Additionally, a diffraction image with significant signal-to-noise ratio to reveal the long-range order can be obtained with a single electron pulse of 700 fs in duration. A direct observation of ultrafast lattice expansion following the irradiation of femtosecond pulsed laser of Ag film has been demonstrated. (C) 2003 American Institute of Physics.

引用

页码：1044 / 1046

页数：3

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