Time and temperature dependencies of imprint characteristics in SrBi2Ta2O9 capacitors -: art. no. 162901

被引：8

作者：

Ashikaga, K ^{[1
]}

Takaya, K ^{[1
]}

Kanehara, T ^{[1
]}

Koiwa, L ^{[1
]}

机构：

[1] Oki Elect Ind Co Ltd, Silicon Solut Co, Syst LSI Res Div, Hachioji, Tokyo 1938550, Japan

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 16期

关键词：

D O I：

10.1063/1.1901821

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The temperature dependence of imprint characteristics in SrBi2Ta2O9 capacitors has been investigated by monitoring changes in switching charges (Δ Q) and hysteresis shifts (Δ V). Activation energies E-a and E-a' were obtained from Δ Q and Δ V, respectively, E-a=0.34 and E-a' = 0.14 eV. The origin of this discrepancy is due to the fact that the relationship between Δ Q and Δ V is not linear, and because the dependence of Δ Q on temperature is overestimated because of the seeming dependence. It is concluded that a detailed investigation of hysteresis shifts is necessary for precise discussions of imprint mechanisms in ferroelectric capacitors. © 2005 American Institute of Physics.

引用

页码：1 / 2

页数：2

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