On the preparation of vanadium doped PVT grown SiC boules with high semi-insulating yield

被引:37
作者
Bickermann, M [1 ]
Weingärtner, R [1 ]
Winnacker, A [1 ]
机构
[1] Univ Erlangen Nurnberg, Dept Mat Sci 6, D-91058 Erlangen, Germany
关键词
doping; impurities; growth from vapor; silicon carbide;
D O I
10.1016/S0022-0248(03)01179-5
中图分类号
O7 [晶体学];
学科分类号
0702 [物理学]; 070205 [凝聚态物理]; 0703 [化学]; 080501 [材料物理与化学];
摘要
Different approaches to prepare SiC crystals with high semi-insulating yield and homogeneous electrical properties by adding a vanadium source in PVT SiC bulk growth are investigated. Up to four different compensation regimes are formed during SiC bulk growth depending on the concentration of other incorporated impurities. Vanadium doping leads to semi-insulating SiC regimes with thermal activation energies of either about 900meV or about 1.7meV as measured with temperature-dependent Hall effect. A yield of semi-insulating material of 80% of the boule has been achieved by a doping technique utilizing an inner container placed inside the crucible. The yield was limited only by the high initial nitrogen incorporation which exceeds the solubility limit of vanadium in SiC of 4 x 10(17) cm(-3) especially in the early stages of growth. Using vanadium/boron co-doping, thermal activation energies of about 1.7eV are found. But in this case the yield is restricted to 40% maximum due to the time-dependent incorporation of vanadium, boron, and nitrogen. Finally, measurement techniques to observe the V3+ and V5+ concentration in the crystal are presented which allow direct determination of the compensation regime at different stages of growth. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:390 / 399
页数:10
相关论文
共 33 条
[1]
Augustine G, 1997, PHYS STATUS SOLIDI B, V202, P137, DOI 10.1002/1521-3951(199707)202:1<137::AID-PSSB137>3.0.CO
[2]
2-Y
[3]
On the preparation of vanadium-doped semi-insulating SiC bulk crystals [J].
Bickermann, M ;
Hofmann, D ;
Straubinger, TL ;
Weingärtner, R ;
Winnacker, A .
SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 :139-142
[4]
Incorporation of boron and the role of nitrogen as a compensation source in SiC bulk crystal growth [J].
Bickermann, M ;
Weingärtner, R ;
Hofmann, D ;
Straubinger, TL ;
Winnacker, A .
SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 :127-130
[5]
On the preparation of semi-insulating SiC bulk crystals by the PVT technique [J].
Bickermann, M ;
Hofmann, D ;
Straubinger, TL ;
Weingärtner, R ;
Wellmann, PJ ;
Winnacker, A .
APPLIED SURFACE SCIENCE, 2001, 184 (1-4) :84-89
[6]
Incorporation of boron and vanadium during PVT growth of 6H-SiC crystals [J].
Bickermann, M ;
Epelbaum, BM ;
Hofmann, D ;
Straubinger, TL ;
Weingärtner, R ;
Winnacker, A .
JOURNAL OF CRYSTAL GROWTH, 2001, 233 (1-2) :211-218
[7]
Silicon carbide for microwave power applications [J].
Brylinski, C .
DIAMOND AND RELATED MATERIALS, 1997, 6 (10) :1405-1413
[8]
Carlson O.N., 1985, Bull. Alloy Phase Diagrams, V6, P115, DOI [10.1007/BF02869220, DOI 10.1007/BF02869220]
[9]
Glass RC, 1996, INST PHYS CONF SER, V142, P37
[10]
Deep level transient spectroscopic and Hall effect investigation of the position of the vanadium acceptor level in 4H and 6H SiC [J].
Jenny, JR ;
Skowronski, J ;
Mitchel, WC ;
Hobgood, HM ;
Glass, RC ;
Augustine, G ;
Hopkins, RH .
APPLIED PHYSICS LETTERS, 1996, 68 (14) :1963-1965