Transonic crack growth along a bimaterial interface: An investigation of the asymptotic structure of near-tip fields

被引：29

作者：

Huang, Y

Liu, C

Rosakis, AJ

机构：

[1] LOS ALAMOS NATL LAB,LOS ALAMOS,NM 87545

[2] CALTECH,GRAD AERONAUT LABS,PASADENA,CA 91125

来源：

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES | 1996年 / 33卷 / 18期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0020-7683(95)00175-1

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

Transonic interfacial crack growth in bimaterial systems is analysed, and the asymptotic field around the moving crack tip is obtained by the straightforward approach of analytic continuation. The power of singularity is less than 1/2 for anti-plane shear deformation. For in-plane deformation, the power of singularity can be real or complex, depending on the speed of the crack tip. Across the Rayleigh wave speed, the real part of the power has a jump of - 1/2, and the imaginary part approaches infinity. The stresses are singular, not only around the crack lip, but also on an entire ray moving with the crack tip. These observations are illustrated by examples using PMMA/steel and Al/Al2O3 bimaterial systems. Copyright (C) 1996 Published by Elsevier Science Ltd.

引用

页码：2625 / 2645

页数：21

共 17 条

[1] THE NEAR-TIP FIELD AT HIGH CRACK VELOCITIES [J].