Symbol Error Probability of Two-Way Amplify-and-Forward Relaying

被引：49

作者：

Guo, Hui ^{[1
,2
]}

Ge, Jianhua ^{[1
]}

Ding, Haiyang ^{[1
]}

机构：

[1] Xidian Univ, State Key Lab Integrated Serv Networks, Xian 710071, Peoples R China

[2] Henan Polytech Univ, Dept Commun Engn, Jiaozuo 454000, Peoples R China

来源：

IEEE COMMUNICATIONS LETTERS | 2011年 / 15卷 / 01期

关键词：

Outage probability; symbol error probability; two-way relaying; OUTAGE;

D O I：

10.1109/LCOMM.2010.01.100983

中图分类号：

TN [电子技术、通信技术];

学科分类号：

080906 [电磁信息功能材料与结构];

摘要：

The overall outage probability (OOP) and symbol error probability (SEP) of a two-way amplify-and-forward (AF) relaying system are investigated. Tight closed-form expressions for the OOP and average SEP are derived for single-relay two-way AF systems. Further, in the case of multiple-relay two-way relaying, a tight closed-form expression for the OOP and an asymptotic approximation to the average SEP are obtained, respectively. Using these expressions, one can evaluate the outage and SEP performance of a two-way relaying system easily and fast.

引用

页码：22 / 24

页数：3

共 12 条

[1]

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[2]

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