Measurement of parallelism of the surfaces of a transparent sample

被引：19

作者：

Bhattacharya, JC ^{[1
]}

机构：

[1] Cent Sci Instruments Org, Opt Div, Chandigarh 160020, India

来源：

OPTICS AND LASERS IN ENGINEERING | 2001年 / 35卷 / 01期

关键词：

parallelism; Lau effect; interferometry; gratings; refractive index; laser rod; optics;

D O I：

10.1016/S0143-8166(00)00102-0

中图分类号：

O43 [光学];

学科分类号：

070207 [光学]; 0803 [光学工程];

摘要：

An interferometric method for the measurement of parallelism of the end faces of a transparent material is described. It is based on the measurement of fringe displacement caused by the wedge angle of the material by using the Lau effect. (C) 2001 Elsevier Science Ltd. All rights reserved.

引用

页码：27 / 31

页数：5