Atomic force microscope study of presmectic modulation in the nematic and isotropic phases of the liquid crystal octylcyanobiphenyl using piezoresistive force detection

被引:21
作者
Carbone, G [1 ]
Barberi, R
Musevic, I
Krzic, U
机构
[1] Univ Calabria, Licryl Liquid Crystal Lab, INFM Res Unit, Phys Dept, I-87036 Cosenza, CS, Italy
[2] Univ Ljubljana, Slovenia Fac Math & Phys, Ljubljana, Slovenia
[3] J Stefan Inst, Ljubljana, Slovenia
来源
PHYSICAL REVIEW E | 2005年 / 71卷 / 05期
关键词
D O I
10.1103/PhysRevE.71.051704
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Using a temperature controlled atomic force microscope (AFM), we have studied surface induced pre-smectic order in the nematic and isotropic phases of 4-cyano-4(')-n-octylbiphenyl. A modified AFM head with piezoresitive cantilevers has been used to measure the structural force between a flat BK7 glass plate and a 10 mu m glass sphere, both being treated to induce homeotropic alignment of the confined liquid crystal layer in between. We have observed surface-induced presmectic force not only in the isotropic, but also in the nematic phase. We have measured the temperature dependencies of the presmectic force, the smectic correlation length xi and the smectic order parameter psi at the surface. The correlation length xi(T) shows a power-law temperature dependence with a critical exponent of nu=0.67 +/- 0.03 and the bare correlation length of xi(0)=(0.39 +/- 0.08) nm, in good agreement with x-ray data. The smectic density at the surface is psi(2)(S)=0.4 in the nematic phase and decreases in the isotropic phase.
引用
收藏
页数:5
相关论文
共 26 条
[1]  
[Anonymous], 1992, INTERMOLECULAR SURFA
[2]   Force-distance curves by atomic force microscopy [J].
Cappella, B ;
Dietler, G .
SURFACE SCIENCE REPORTS, 1999, 34 (1-3) :1-+
[3]   HIGH-RESOLUTION X-RAY AND LIGHT-SCATTERING STUDY OF CRITICAL BEHAVIOR ASSOCIATED WITH THE NEMATIC-SMECTIC-A TRANSITION IN 4-CYANO-4'-OCTYLBIPHENYL [J].
DAVIDOV, D ;
SAFINYA, CR ;
KAPLAN, M ;
DANA, SS ;
SCHAETZING, R ;
BIRGENEAU, RJ ;
LITSTER, JD .
PHYSICAL REVIEW B, 1979, 19 (03) :1657-1663
[4]  
de Gennes P. G., 1975, PHYS LIQUID CRYSTALS
[5]   INTERACTIONS BETWEEN SOLID-SURFACES IN A PRESMECTIC FLUID [J].
DEGENNES, PG .
LANGMUIR, 1990, 6 (09) :1448-1450
[6]   PIEZORESISTIVE CANTILEVERS UTILIZED FOR SCANNING TUNNELING AND SCANNING FORCE MICROSCOPE IN ULTRAHIGH-VACUUM [J].
GIESSIBL, FJ ;
TRAFAS, BM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (06) :1923-1929
[7]   Piezoresistive sensors for scanning probe microscopy [J].
Gotszalk, T ;
Grabiec, P ;
Rangelow, IW .
ULTRAMICROSCOPY, 2000, 82 (1-4) :39-48
[8]  
Gray GW., 1962, Molecular structure and the properties of liquid crystals
[9]   Noise in piezoresistive atomic force microscopy [J].
Hansen, O ;
Boisen, A .
NANOTECHNOLOGY, 1999, 10 (01) :51-60
[10]   FORCES DUE TO STRUCTURE IN A THIN LIQUID-CRYSTAL FILM [J].
HORN, RG ;
ISRAELACHVILI, JN ;
PEREZ, E .
JOURNAL DE PHYSIQUE, 1981, 42 (01) :39-52