In-situ synchrotron far infrared spectroscopy of surface films on a copper electrode in aqueous solutions

被引：61

作者：

Melendres, CA

Bowmaker, GA

Leger, JM

Beden, B

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Div Chem Technol, Argonne, IL 60439 USA

[3] Univ Auckland, Dept Chem, Auckland, New Zealand

[4] Univ Poitiers, Chem Lab, CNRS, Poitiers, France

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1998年 / 449卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

synchrotron source; infrared reflection-absorption spectra; spectroelectrochemical behavior of copper; synchrotron far IR spectroscopy;

D O I：

10.1016/S0022-0728(97)00609-8

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Far infrared spectra of the surface films formed upon anodic oxidation of copper have been obtained in-situ for the first time in aqueous solution environments using a synchrotron source. The spectroelectrochemical behavior of copper was studied in NaOH and in a dilute solution of KSCN in perchlorate. The oxide film at - 0.05 V vs. SCE in 0.1 M NaOH solution has been identified as Cu2O. In the passive region at 0.3 V, CuO and Cu(OH), appear to be present on the surface. Vibrational bands observed in 0.025 M KSCN + perchlorate solution are attributed to a multilayer film of copper(I) thiocyanate. (C) 1998 Elsevier Science S.A. All rights reserved.

引用

页码：215 / 218

页数：4

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