Density fluctuations in amorphous systems: SAXS and PALS results

被引：16

作者：

David, L

Vigier, G

Etienne, S

Faivre, A

Soles, CL

Yee, AF

机构：

[1] Inst Natl Sci Appl Lyon, GEMPPM, CNRS, UMR 5510, F-69621 Villeurbanne, France

[2] Ecole Mines, LPM, CNRS, UMR 7556, F-54041 Nancy, France

[3] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1998年 / 235卷

关键词：

D O I：

10.1016/S0022-3093(98)00598-5

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The electronic density fluctuations in polymethyl methacrylate (PMMA) were studied by synchrotron radiation small angle X-ray scattering (SAXS), and compared with the hole volumes as revealed by positron annihilation lifetime spectroscopy (PALS). The results of both methods are shown to be compatible with a structure of the liquid and the glass with local heterogeneities of radius of the order of 0.3 nm. These microstructural investigations thus support the existence of density fluctuations in amorphous systems on a nanometer scale. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：383 / 387

页数：5

共 11 条

[1] CONFIGURATIONAL EXCITATIONS IN CONDENSED MATTER, AND BOND LATTICE MODEL FOR LIQUID-GLASS TRANSITION [J].