A new magnetic semiconductor Cd1-xMnxGeP2

被引:19
作者
Medvedkin, GA
Ishibashi, T
Nishi, T
Sato, K
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Tokyo Univ Agr & Technol, Fac Technol, Tokyo 1848588, Japan
关键词
Concentration Profile; Concentration Ratio; Electromagnetism; Unit Cell Parameter; Transition Element;
D O I
10.1134/1.1356149
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A new semiconductor material, which comprises a solid solution of a ternary diamond-like semiconductor and transition element Mn, was grown and investigated. According to X-ray diffraction data, the crystal structure of the material is similar to that of the CdGeP2 host substance with a chalcopyrite-type crystal structure. The interplanar distances and the unit cell parameter decrease with an increase in Mn content: a = 5.741 Angstrom --> 5.710 Angstrom --> 5.695 Angstrom in the series of CdGeP2 --> Cd1-xMnxGeP2 --> Cd1-yMnyGeP2 compounds (x < y). The surface composition and in-depth concentration profiles for elements of a Cd-Mn-Ge-P quaternary system were investigated using electron microscopy and energy dispersive X-ray spectroscopy. The molecular concentration ratio for Mn and Cd at a depth of 0.4 mum is Mn/Cd = 0.2. (C) 2001 MAIK "Nauka/ Interperiodica".
引用
收藏
页码:291 / 294
页数:4
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