Direct topographic measurement of multilayers on water by atomic force microscopy

被引：10

作者：

Dubreuil, F

Daillant, J

Guenoun, P ^{[1
]}

机构：

[1] CEA Saclay, SPEC, F-91191 Gif Sur Yvette, France

[2] MPIGK, D-14424 Potsdam, Germany

[3] Ctr Univ Paris Sud, CEA, CNRS, LURE,MJENR, F-91898 Orsay, France

来源：

LANGMUIR | 2003年 / 19卷 / 20期

关键词：

D O I：

10.1021/la0343268

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We report a new experimental method allowing the direct observation of Langmuir films at the air/water interface by atomic force microscopy. Using this method a quantitative observation of multilayer formation in various systems, such as gold nanoparticles and polymerized octadecyltrichlorosilane layers, could be achieved. In particular, a high vertical resolution is reached (around 1 nm) which enables topographic measurements on Langmuir multilayers in the submicrometer range.

引用

收藏

页码：8409 / 8415

页数：7

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