CMOS charged particle spectrometers

被引：2

作者：

Soli, GA

Garrett, HB

Fossum, ER

机构：

[1] Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 03期

关键词：

D O I：

10.1109/23.507095

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Integrated circuits, manufactured in CMOS technology, have been developed as diffusion-based charged particle spectrometers for space applications. Current designs are single-chip spectrometers capable of uniquely identifying and counting electrons and heavy ions. A four-chip spectrometer designed to count protons and heavy ions was flown on the Clementine spacecraft. The spectrometer proton data is compared to GOES-6 proton data for the 21 February 1994 solar proton event.

引用

页码：1516 / 1520

页数：5