Direct measurement of the binding energy and bohr radius of a single hydrogenic defect in a semiconductor quantum well

被引:16
作者
Perraud, Simon [1 ,2 ]
Kanisawa, Kiyoshi [1 ]
Wang, Zhao-Zhong [2 ]
Fujisawa, Toshimasa [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
[2] CNRS, Lab Photon & Nanostruct, F-91460 Marcoussis, France
关键词
D O I
10.1103/PhysRevLett.100.056806
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Low-temperature scanning tunneling spectroscopy under ultrahigh vacuum was used to study donor point defects located at the epitaxial surface of an In0.53Ga0.47As quantum well. The electronic local density of states was measured with nanoscale resolution in the vicinity of single defects. In this way, both the binding energy and the Bohr radius of the defects could be determined. The binding energy and the Bohr radius were found to be functions of the quantum well thickness, in quantitative agreement with variational calculations of hydrogenic impurity states.
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页数:4
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