How we test Siemens' Embedded DRAM Cores

被引：11

作者：

McConnell, R ^{[1
]}

Möller, U ^{[1
]}

Richter, D ^{[1
]}

机构：

[1] Siemens Semicond, D-81541 Munich, Germany

来源：

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/TEST.1998.743313

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The techniques used to test Siemens Embedded DRAM Cores are described. Test Isolation and Design-For-Test logic is built in to the core interface, while external access and Algorithmic Pattern Generation are handled by a central Test Controller All tests used for standard DRAM's can be applied to the DRAM cores, but only a subset of these are used for any given product.

引用

页码：1120 / 1125

页数：6