A novel logarithmic response CMOS image sensor with high output voltage swing and in-pixel fixed-pattern noise reduction

被引：47

作者：

Lai, LW ^{[1
]}

Lai, CH ^{[1
]}

King, YC ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Elect Engn, Microelect Lab, Semiconductor Technol Appl Res Grp, Hsinchu, Taiwan

来源：

IEEE SENSORS JOURNAL | 2004年 / 4卷 / 01期

关键词：

Amplification - Electric potential - Image sensors - Leakage currents - Noise abatement - Photodiodes - Transistors;

D O I：

10.1109/JSEN.2003.820339

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel logarithmic response CMOS image sensor fabricated by 0.25-mum CMOS logic process is proposed. The new cell has an output voltage swing of I V in the targeted illumination range, which makes it less susceptible to noises in the readout system. Furthermore, the proposed new cell with in-pixel CDS control drastically reduces the fixed pattern noise in logarithmic mode CMOS APS. Comparing with a conventional pixel, a reduction of 10 times in fixed-pattern noise is demonstrated in the new logarithmic response CMOS image sensor.

引用

页码：122 / 126

页数：5

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