The effect of transport ratio and ion energy on the mechanical properties of IBAD niobium nitride coatings

被引:16
作者
Klingenberg, ML
Demaree, JD
机构
[1] Concurrent Technol Corp, Johnstown, PA 15904 USA
[2] AMSRL WM MC, Army Res Lab, Aberdeen Proving Ground, MD 21005 USA
关键词
niobium nitride films; ion beam assisted deposition (IBAD); nitrogen ion beams;
D O I
10.1016/S0257-8972(01)01393-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Niobium nitride films were produced by ion beam assisted deposition (IBAD) using low (90 eV) and moderate (750-800 eV) energy nitrogen ion beams and electron-beam evaporated niobium. The transport ratios (ion to atom arrival ratios) used were approximately 0.062, 0.125, 0.25, 0.33, 0.50, 0.75 and 1.0. The resulting microstructure, crystal phase, and composition of the films were characterized using scanning electron microscopy (SEM), X-ray diffraction (XRD), transmission electron microscopy (TEM), and Rutherford backscattering spectrometry (RBS), The hardness, coefficient of friction, and wear resistance were assessed. The research detailed herein describes relationships between MAD process parameters, NbN film structure and phase, and the mechanical properties of the films. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:243 / 249
页数:7
相关论文
共 22 条
[1]   Structure and properties of NbN and TaN films prepared by ion beam assisted deposition [J].
Baba, K ;
Hatada, R ;
Udoh, K ;
Yasuda, K .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 127 :841-845
[2]  
BARNETT SA, 1996, DOEER454345, P5
[4]  
FENSKE G, 1991, ADV CERAMICS REP MAR, P25
[5]   CHEMICAL BONDING AND X-RAY-EMISSION SPECTRA ANALYSIS FOR NIOBIUM CARBIDE, NITRIDE AND OXIDE [J].
GUPTA, M ;
GUBANOV, VA ;
ELLIS, DE .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1977, 38 (05) :499-507
[6]   The chemistry, structure, and resulting wear properties of magnetron-sputtered NbN thin films [J].
Havey, KS ;
Zabinski, JS ;
Walck, SD .
THIN SOLID FILMS, 1997, 303 (1-2) :238-245
[7]  
Hotovy I, 1997, PHYS STATUS SOLIDI A, V161, P97, DOI 10.1002/1521-396X(199705)161:1<97::AID-PSSA97>3.0.CO
[8]  
2-O
[9]   FUNDAMENTALS OF ION-BEAM-ASSISTED DEPOSITION .2. ABSOLUTE CALIBRATION OF ION AND EVAPORANT FLUXES [J].
HUBLER, GK ;
VANVECHTEN, D ;
DONOVAN, EP ;
CAROSELLA, CA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (02) :831-839
[10]  
HUBLER GK, 1994, ASM HDB, V5, P593