Gain-bandwidth product analysis of InAlGaAs-InAlAs superlattice avalanche photodiodes

被引:22
作者
Watanabe, I
Tsuji, M
Makita, K
Taguchi, K
机构
[1] Opto-Electronics Res. Laboratories, NEC Corp., Tsukuba, Ibaraki 305
关键词
D O I
10.1109/68.484263
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The gain-bandwidth (GB) product of InAlAs-InAlGaAs quaternary well superlattice avalanche photodiodes (SL-APD's) has been analyzed by solving current-continuity equations including electron and hole impact ionization rates in a separate absorption and multiplication (SAM) structure. The results indicate that the GB product of InAlGaAs quaternary well SL-APD's can be increased to more than 150 GHz by decreasing the thickness of a p(+)-InP field buffer layer. This is due to reduced ionization in the p(+)-InP field buffer layer, which has an opposite ionization rate ratio compared to the superlattice. This analysis was experimentally confirmed by a GB product of 150 GHz for the SL-APD's with a 33.4 nm thick p(+)-InP field buffer layer. The GB product obtained is the largest value in III-V compound-semiconductor APD's, to our knowledge.
引用
收藏
页码:269 / 271
页数:3
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