Detector calibration in the wavelength region 10 nm to 100 nm based on a windowless rare gas ionization chamber

被引:20
作者
Saito, T
Onuki, H
机构
关键词
D O I
10.1088/0026-1394/32/6/26
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A detector calibration facility based on a rare gas ionization chamber has been built at the Electrotechnical Laboratory, Japan. We have realized a windowless system by applying strong differential pumping, which features no spectral limitation and easy gas handling. In the auto-ionization region near the xenon absorption edge, photon flux was found to be underestimated and this limited the maximum available wavelength to 92 nm. The uncertainty (1 sigma) for a Si photodiode calibration was estimated to be within +/-9% in the wavelength range 10 nm to 92 nm.
引用
收藏
页码:525 / 529
页数:5
相关论文
共 9 条
[1]   STABILITY AND QUANTUM EFFICIENCY PERFORMANCE OF SILICON PHOTODIODE DETECTORS IN THE FAR ULTRAVIOLET [J].
CANFIELD, LR ;
KERNER, J ;
KORDE, R .
APPLIED OPTICS, 1989, 28 (18) :3940-3943
[2]   SELF-CALIBRATION OF SEMICONDUCTOR PHOTODIODES IN THE SOFT-X-RAY REGION [J].
KRUMREY, M ;
TEGELER, E .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :797-801
[3]  
Radzig A. A., 1985, Reference Data on Atoms, Molecules and Ions
[4]   DETECTOR CALIBRATION IN THE 10-60 NM SPECTRAL RANGE AT THE ELECTROTECHNICAL LABORATORY [J].
SAITO, T ;
ONUKI, H .
JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1993, 24 (01) :23-30
[5]  
SAITO T, 1992, B ELECTROTECHNICAL L, V56, P1304
[6]   ABSOLUTE RADIOMETRIC CALIBRATION OF DETECTORS BETWEEN 200-600A [J].
SALOMAN, EB ;
EDERER, DL .
APPLIED OPTICS, 1975, 14 (04) :1029-1034
[7]   ABSOLUTE PHOTON-FLUX MEASUREMENTS IN VACUUM ULTRAVIOLET [J].
SAMSON, JAR ;
HADDAD, GN .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (01) :47-54
[8]   ABSOLUTE INTENSITY MEASUREMENTS IN VACUUM ULTRAVIOLET [J].
SAMSON, JAR .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (01) :6-+
[9]  
SUZUKI IH, 1992, B ELECTROTECHNICAL L, V56, P688