Tangent vector applied to voltage collapse and loss sensitivity studies

被引:24
作者
de Souza, ACZ [1 ]
机构
[1] Escola Fed Engn Itajuba, Grp Engn Sistemas, BR-37500000 Itajuba, MG, Brazil
关键词
tangent vector; voltage collapse; loss sensitivity;
D O I
10.1016/S0378-7796(98)00048-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The search for a reliable and computationally efficient index for voltage security analysis has been the subject of concern of many researchers. Recently, a method based on the tangent vector technique has been shown to be accurate as a voltage stability index and also as an indicator of the system weak area. This technique is tested in this paper with different load scenarios. The tangent vector technique is then used as a tool for determination of system loss sensitivity. This new application for the tangent vector technique is tested in the IEEE-14 bus system test. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:65 / 70
页数:6
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