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Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape

被引：86
作者：
Ünveren, E
Kemnitz, E
Hutton, S
Lippitz, A
Unger, WES [1 ]
机构：
[1] Bundesanstalt Mat Forsch & Prufung, BAM, Lab Surface & Thin Film Anal 823, D-12200 Berlin, Germany
[2] Humboldt Univ, Inst Chem, D-12489 Berlin, Germany
[3] Kratos Analyt Ltd, Manchester M17 1GP, Lancs, England
来源：
SURFACE AND INTERFACE ANALYSIS | 2004年 / 36卷 / 01期
关键词：
high-resolution XPS; Cr2O3; powder; multiplet splitting;
D O I：
10.1002/sia.1655
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
By using modern XPS systems it is possible to obtain spectra with well-resolved spin orbit, multiplet and field splitting even with powder samples mounted using adhesive tape. Measurement of Cr2O3 powder with the latest generation of XPS spectrometers, which are able to analyse non-conductive powders with ultimate energy resolution, revealed multiplet splitting features and satellite emission in the Cr 2p spectrum. Therefore, peak-fit analysis of Cr 2p XPS spectra of Cr(III) compounds requires a more appropriate approach and common practice has to be reconsidered. One possible way to analyse this spectrum is proposed, based on the experimental and theoretical work of other authors. Copyright (C) 2004 John Wiley Sons, Ltd.
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页码：92 / 95
页数：4
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