The energy-dispersive reflectometer at BESSY II:: a challenge for thin film analysis

被引:24
作者
Pietsch, U
Grenzer, J
Geue, T
Neissendorfer, F
Brezsesinski, G
Symietz, C
Möhwald, H
Gudat, W
机构
[1] Univ Potsdam, Inst Phys, D-14415 Potsdam, Germany
[2] Inst Astrophys, D-14482 Potsdam, Germany
[3] MPI Kolloid & Grenzflachenforsch, D-14476 Golm, Germany
[4] BESSY GmbH, D-12489 Berlin, Germany
关键词
energy-dispersive reflectometry; synchrotron radiation; X-ray diffuse scattering;
D O I
10.1016/S0168-9002(01)00730-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Installed in 1999 the energy-dispersive reflectometer at the 13.2 bending magnet employs the exponentially decaying white X-ray emission spectrum of the 1.7 GeV storage ring of BESSY II outside the vacuum. Using an energy-dispersive detector specular and longitudinal-diffuse reflectivity spectra of thin films can be recorded simultaneously between 0.2 Angstrom (-1) <q(z) < 1.2 Angstrom (-1) within a few seconds. The capability of the experiment is demonstrated probing the correlation length of Cd-arachidate and -stearate films at room temperature and its change during annealing. At T = 70 degreesC we observe an instantaneous decay of specular Bragg peaks accompanied with an increase of the diffuse scattering. This indicates the onset of the melting of 2D-ordered acid domains. The vertical diffusion coefficient is estimated to be about 2 x 10(-24) m(2)/s. (C) 2001 Elsevier Science BN. All rights reserved.
引用
收藏
页码:1077 / 1080
页数:4
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