Amphoteric charge states and diffusion barriers of hydrogen in GaAs

被引:13
作者
Wang, C [1 ]
Zhang, QM
机构
[1] Natl Dong Hwa Univ, Dept Phys, Hualien 974, Taiwan
[2] Univ Texas, Dept Phys, Arlington, TX 76019 USA
来源
PHYSICAL REVIEW B | 1999年 / 59卷 / 07期
关键词
D O I
10.1103/PhysRevB.59.4864
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The states and microscopic diffusion mechanisms of hydrogen in crystalline GaAs are investigated by the ab initio molecular-dynamics method. The static equilibrium position for neutral hydrogen is found around the bond-centered (BC) site as in crystalline Si. As a negative U center, the hydrogen behaves as a stable donor around the bond-centered site in the p-type material, while it acts as a stable acceptor around the interstitial site surrounded by four nearest Ca host atoms in the n-type material. The hydrogen cation diffuses along the BC-C-Ga-BC-C-As-BC path in a high valence electron density region with a barrier of 0.46 eV in p-type materials. On the other hand, the hydrogen anion diffuses along the T-Ga-Hex-T-As-Hex-T-Ga path in a low electron density region with a barrier of 0.55 eV in the n-type material. The diffusion is more effective in p-type GaAs. Good agreement with experiments is found. Based on these results, the amphoteric behavior of hydrogen, its passivation effects of dopants, and its diffusion mechanisms can be understood in both p-type and n-type GaAs.
引用
收藏
页码:4864 / 4868
页数:5
相关论文
共 37 条
[1]   PSEUDOPOTENTIALS THAT WORK - FROM H TO PU [J].
BACHELET, GB ;
HAMANN, DR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1982, 26 (08) :4199-4228
[2]   THEORY OF THE SILICON VACANCY - AN ANDERSON NEGATIVE-U SYSTEM [J].
BARAFF, GA ;
KANE, EO ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1980, 21 (12) :5662-5686
[3]   Doping properties of C, Si, and Ge impurities in GaN and AlN [J].
Boguslawski, P ;
Bernholc, J .
PHYSICAL REVIEW B, 1997, 56 (15) :9496-9505
[4]   NATIVE DEFECTS IN GALLIUM NITRIDE [J].
BOGUSLAWSKI, P ;
BRIGGS, EL ;
BERNHOLC, J .
PHYSICAL REVIEW B, 1995, 51 (23) :17255-17258
[5]   ABINITIO CALCULATIONS ON THE PASSIVATION OF SHALLOW IMPURITIES IN GAAS [J].
BRIDDON, PR ;
JONES, R .
PHYSICAL REVIEW LETTERS, 1990, 64 (21) :2535-2538
[6]   THERMAL-EXPANSION OF C-SI VIA ABINITIO MOLECULAR-DYNAMICS [J].
BUDA, F ;
CAR, R ;
PARRINELLO, M .
PHYSICAL REVIEW B, 1990, 41 (03) :1680-1683
[7]   UNIFIED APPROACH FOR MOLECULAR-DYNAMICS AND DENSITY-FUNCTIONAL THEORY [J].
CAR, R ;
PARRINELLO, M .
PHYSICAL REVIEW LETTERS, 1985, 55 (22) :2471-2474
[8]   THEORY OF HYDROGEN PASSIVATION OF SHALLOW-LEVEL DOPANTS IN CRYSTALLINE SILICON [J].
CHANG, KJ ;
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1988, 60 (14) :1422-1425
[9]   DIATOMIC-HYDROGEN-COMPLEX DIFFUSION AND SELF-TRAPPING IN CRYSTALLINE SILICON [J].
CHANG, KJ ;
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1989, 62 (08) :937-940
[10]   ELECTRIC-FIELD-ENHANCED DISSOCIATION OF THE HYDROGEN-SI DONOR COMPLEX IN GAAS [J].
CHO, HY ;
KIM, EK ;
MIN, SK ;
CHANG, KJ ;
LEE, CC .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (10) :5077-5080