Maize starch yield calibrations with near infrared reflectance

被引:19
作者
Paulsen, MR
Pordesimo, LO
Singh, M
Mbuvi, SW
Ye, BY
机构
[1] Univ Illinois, Dept Agr Engn, Urbana, IL 61801 USA
[2] Univ Tennessee, Dept Agr & Biosyst Engn, Knoxville, TN 37901 USA
[3] Illinois Crop Improvement Assoc, Ident Preserved Grain Lab, Champaign, IL 61820 USA
关键词
D O I
10.1016/S1537-5110(03)00082-5
中图分类号
S2 [农业工程];
学科分类号
0828 ;
摘要
Maize starch yield is affected by variety, environmental growing conditions, and drying conditions. One-hundred gram starch yield tests that predict actual wet milling starch yield were used as a reference method for developing an extractable starch calibration on a NIRSystems Model 6500 spectrophotometer. A maize starch yield calibration was developed from 940 samples and used to predict a validation set of 304 samples. It had a standard error of prediction (SEP) of 1.06, a coefficient of determination r(2) of 0.77 and a ratio of performance to deviations (rpd) of 2.1. This indicates about 95% of similar samples could have starch yield predicted by near-infrared reflectance within about+/-2.1%. The calibration should be successful in segregating maize lots for high and low starch yield percentages. (C) 2003 Silsoe Research Institute. All rights reserved.Published by Elsevier Science Ltd.
引用
收藏
页码:455 / 460
页数:6
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