Deposition of SiOx diffusion barriers on flexible packaging materials by PECVD

被引:81
作者
Bieder, A [1 ]
Gruniger, A [1 ]
von Rohr, PR [1 ]
机构
[1] ETH, Inst Proc Engn, CH-8092 Zurich, Switzerland
关键词
silicon oxide; diffusion barrier; PECVD; water vapor permeability; RF mode; dual mode; COATINGS; PERMEATION; TRANSPORT; OXYGEN; FILMS;
D O I
10.1016/j.surfcoat.2005.02.004
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This study focuses on the water vapor permeability of plasma enhanced chemical vapor deposited (PECVD) silicon oxide (SiOx) films. A batch reactor equipped with a 2.45 GHz slot antenna plasma source and a 13.56 MHz-biased substrate holder, was used to conduct the experiments. The remote microwave and the direct radio frequency plasma source can be operated separately or in dual mode. An oxygen plasma was generated and hexamethyldisiloxane (HMDSO) used as monomer. The SiO2-like films were deposited onto 12 mu m PET film. An increase of RF-power input, oxygen-to-monomer flow rate ratio, layer thickness or decrease of process pressure was found to enhance the gas barrier performance. Compared to uncoated PET films, a maximum reduction of more than a factor of 150 has been achieved for water vapor transmission rate. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:928 / 931
页数:4
相关论文
共 14 条
[1]  
[Anonymous], 2001, Plasmas Polym, DOI [10.1023/A:1011308919705, DOI 10.1023/A:1011308919705]
[2]  
Doremus RobertH., 1994, GLASS SCI
[3]   SiOx gas barrier coatings on polymer substrates:: Morphology and gas transport considerations [J].
Erlat, AG ;
Spontak, RJ ;
Clarke, RP ;
Robinson, TC ;
Haaland, PD ;
Tropsha, Y ;
Harvey, NG ;
Vogler, EA .
JOURNAL OF PHYSICAL CHEMISTRY B, 1999, 103 (29) :6047-6055
[4]   Atomic force microscopy (AFM) morphological surface characterization of transparent gas barrier coatings on plastic films [J].
GarciaAyuso, G ;
Vazquez, L ;
MartinezDuart, JM .
SURFACE & COATINGS TECHNOLOGY, 1996, 80 (1-2) :203-206
[5]  
Gruniger Andrea Susanne, 2004, PhD thesis,
[6]   A microstructural study of transparent metal oxide gas barrier films [J].
Henry, BM ;
Dinelli, F ;
Zhao, KY ;
Grovenor, CRM ;
Kolosov, OV ;
Briggs, GAD ;
Roberts, AP ;
Kumar, RS ;
Howson, RP .
THIN SOLID FILMS, 1999, 355 :500-505
[7]   Microstructure evolution in amorphous Ge/Si multilayers grown by magnetron sputter deposition [J].
Jarrendahl, K ;
Ivanov, I ;
Sundgren, JE ;
Radnoczi, G ;
Czigany, Z ;
Greene, JE .
JOURNAL OF MATERIALS RESEARCH, 1997, 12 (07) :1806-1815
[8]   Room temperature deposition of silicon dioxide films by ion-assisted plasma enhanced chemical vapor deposition [J].
Lee, JH ;
Kim, DS ;
Lee, YH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (04) :1443-1451
[9]   Durability of nanosized oxygen-barrier coatings on polymers - Internal stresses [J].
Leterrier, Y .
PROGRESS IN MATERIALS SCIENCE, 2003, 48 (01) :1-55
[10]   COMPARISON OF MICROWAVE AND RF PLASMAS - FUNDAMENTALS AND APPLICATIONS [J].
MOISAN, M ;
WERTHEIMER, MR .
SURFACE & COATINGS TECHNOLOGY, 1993, 59 (1-3) :1-13