Thickness dependent perpendicular magnetic domain patterns in sputtered epitaxial FePt(001) L10 films

被引：4

作者：

Thiele, JU ^{[1
]}

Folks, L ^{[1
]}

Toney, NF ^{[1
]}

Weller, DK ^{[1
]}

机构：

[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA

来源：

HIGH-DENSITY MAGNETIC RECORDING AND INTEGRATED MAGNETO-OPTICS: MATERIALS AND DEVICES | 1998年 / 517卷

关键词：

D O I：

10.1557/PROC-517-319

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The present paper discusses the magnetic anisotropy and magnetic domain structure of highly ordered epitaxial FePt(001) films grown on Pt seeded MgO(001) substrates. These films were grown by dc-magnetron sputtering from a Fe50Pt50 alloy target at a substrate temperature of 550 degrees C during deposition. Thicknesses were varied between 15 and 170 nm. The presence of the highly anisotropic face centered tetragonal L1(0) crystal structure with a maximum long range chemical ordering of 95% and a low degree of misorientations was confirmed by specular and grazing incidence X-ray diffraction measurements. For film thicknesses greater than or equal to 50 nm in-plane and out-of-plane hysteresis measurements indicate large perpendicular magnetic anisotropy and at the same time low remanent magnetisation. Magnetic force microscopy reveals highly interconnected perpendicular stripe domain patterns. From their characteristic width, which is strongly dependent on the film thickness, a value of the dipolar length, D-0, of 50 +/-5 nm is derived. Assuming an exchange constant of 10(-6) erg/cm, this value is consistent with an anisotropy constant K-U similar to 1.10(8) erg/cc.

引用

页码：319 / 324

页数：6