Current single event effect test results for candidate spacecraft electronics

被引：6

作者：

LaBel, KA

Moran, AK

Hawkins, DK

Sanders, AB

Seidleck, CM

Kim, HS

Forney, JE

Stassinopoulos, EG

Marshall, P

Dale, C

Kinnison, J

Carkhuff, B

机构：

来源：

1996 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 1996年

关键词：

D O I：

10.1109/REDW.1996.574184

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC Converters.

引用

页码：19 / 27

页数：9