Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films

被引：240

作者：

Miller, JD ^{[1
]}

Veeramasuneni, S ^{[1
]}

Drelich, J ^{[1
]}

Yalamanchili, MR ^{[1
]}

Yamauchi, G ^{[1
]}

机构：

[1] NIPPON TELEGRAPH & TEL PUBL CORP, TECH ASSISTANCE & SUPPORT CTR, MUSASHINO, TOKYO 180, JAPAN

来源：

POLYMER ENGINEERING AND SCIENCE | 1996年 / 36卷 / 14期

关键词：

D O I：

10.1002/pen.10580

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

The influence of film roughness on the wetting properties of vacuum-deposited polytetrafluroethylene (PTFE) thin films has been investigated using atomic force microscopy (AFM) and contact angle goniometry. Surface roughness has been characterized by atomic force microscopy in terms of RMS roughness (R(q)) and fractal dimensions. A contact angle correlation with surface roughness, as determined by AFM, is evident from these results, which are discussed on the basis of wetting theory. The results also confirm that the high water contact angles (as high as 150 degrees) recently observed at the surface of a new water repulsive coating material (mixture of PTFE and binder) are because of surface roughness. Such measurements clarify the effect of nanometer-size surface asperities on the wetting properties of hydrophobic coatings.

引用

页码：1849 / 1855

页数：7

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