Fast resistive bolometry

被引：64

作者：

Spielman, RB ^{[1
]}

Deeney, C ^{[1
]}

Fehl, DL ^{[1
]}

Hanson, DL ^{[1
]}

Keltner, NR ^{[1
]}

McGum, JS ^{[1
]}

McKenney, JL ^{[1
]}

机构：

[1] Sandia Natl Labs, Albuquerque, NM 87185 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 01期

关键词：

D O I：

10.1063/1.1149488

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Resistive bolometry is an accurate, robust, spectrally broadband technique for measuring absolute x-ray fluence and flux. Bolometry is an independent technique for x-ray measurements that is based on a different set of physical properties than other diagnostics such as x-ray diodes, photoconducting detectors, and P-I-N diodes. Bolometers use the temperature-driven change in element resistivity to determine the total deposited energy. The calibration of such a device is based on fundamental material properties and its physical dimensions. We describe the use of nickel and gold bolometers to measure x rays generated by high-power z pinches on Sandia's Saturn and Z accelerators. The Sandia bolometer design described herein has a pulse response of similar to 1 ns. We describe in detail the fabrication, fielding, and data analysis issues leading to highly accurate x-ray measurements. The fundamental accuracy of resistive bolometry will be discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)52701-9].

引用

页码：651 / 655

页数：5

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[7]

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