Raman excitation profile of a sterically protected diphosphene [ArP = PAr]

被引：9

作者：

Copeland, T ^{[1
]}

Shea, MP ^{[1
]}

Milliken, MC ^{[1
]}

Smith, RC ^{[1
]}

Protasiewicz, JD ^{[1
]}

Simpson, MC ^{[1
]}

机构：

[1] Case Western Reserve Univ, Dept Chem, Cleveland, OH 44106 USA

来源：

ANALYTICA CHIMICA ACTA | 2003年 / 496卷 / 1-2期

基金：

美国国家科学基金会; 美国国家卫生研究院;

关键词：

resonance; Raman spectroscopy; diphosphene; photochemistry;

D O I：

10.1016/S0003-2670(03)00996-6

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The resonance Raman excitation profile (RREP) of the bis[2,6-di(m-xylyl)phenyl]P-2 diphosphene (DxpP=PDxp) in CDCl3 was measured in the region of overlap between the pi-pi* (368 nm) and n(+)-pi* (459 nm) UV/visible electronic absorption bands. The P=P stretch (622 cm(-1)) was enhanced much more strongly in resonance with the allowed pi-pi* than with the symmetry-forbidden n(+)-pi*. The observed differences are attributed to differences in the geometries of the excited states and to the different mechanisms of enhancement for resonance with allowed and forbidden electronic absorptions. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：155 / 163

页数：9

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