Reliability of LiNbO3 based integrated optical waveguide devices for fiber communication systems

被引：4

作者：

Nagata, H ^{[1
]}

Mitsugi, N ^{[1
]}

Higuma, K ^{[1
]}

Ichikawa, J ^{[1
]}

Sakamoto, T ^{[1
]}

Fujino, T ^{[1
]}

Shinriki, T ^{[1
]}

机构：

[1] Sumitomo Osaka Cement Co Ltd, New Technol Res Lab, Optoelect Res Grp, Funabashi, Chiba 2748601, Japan

来源：

RELIABILITY OF PHOTONICS MATERIALS AND STRUCTURES | 1998年 / 531卷

关键词：

D O I：

10.1557/PROC-531-359

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Increasing demands for LiNbO3 (LN) optical waveguide devices installed into submarine and terrestrial fiber communication systems necessitate that high quality and long-term reliability (over 20 years) be established. In addition to general requirements for reliability in electrooptical devices, the LN devices need to assure of the de-drift phenomena in the optical output signal. The de-drift is caused by the complex electrical nature of constituent device materials; ie. LN substrates and SiO2 buffer layers on LN. Results of theoretical and experimental investigations of the suppression of de-drift are applied to the design of practical LN devices, and the devices have been in service for 4 years, as of this moment, without any failure. Here, problems on the de-drift are discussed from the viewpoints of device reliability and actual fabrication processes.

引用

页码：359 / 370

页数：12