Voltage tolerance testing of three-phase voltage source converters

被引：44

作者：

Sannino, A ^{[1
]}

Bollen, MHJ

Svensson, J

机构：

[1] Chalmers Univ Technol, Dept Elect Power Engn, S-41296 Gothenburg, Sweden

[2] ABB Power Technol, Gothenburg, Sweden

来源：

IEEE TRANSACTIONS ON POWER DELIVERY | 2005年 / 20卷 / 02期

关键词：

EMC; immunity; power electronics; power quality; voltage dip (voltage sag);

D O I：

10.1109/TPWRD.2004.833881

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes a protocol for testing the immunity of three-phase self-commutated converters to voltage dips. An overview of voltage dips due to short circuits and earth faults that may affect a converter is given and their effect on the converter is demonstrated through simulation. Results confirm that the existing standard protocol given in IEC 61000-4-11 is not complete. An extended testing protocol is therefore proposed, which is compatible with IEC 61000-4-11.

引用

页码：1633 / 1639

页数：7

共 13 条

[1]

[Anonymous], 61000411 IEC

[2]

Bollen M.H.J., 2000, Series on Power Engineering

[3] Different methods for classification of three-phase unbalanced voltage dips due to faults [J].

Bollen, MHJ ;

Zhang, LD .

ELECTRIC POWER SYSTEMS RESEARCH, 2003, 66 (01) :59-69

[4] Effect of voltage sags on adjustable-speed drives:: A critical evaluation and an approach to improve performance [J].

Durán-Gómez, JL ;

Enjeti, PN ;

Woo, BO .

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1999, 35 (06) :1440-1449

[5]

KEUS AK, P IEEE INT C EL MACH, P213

[6] Vector current controlled voltage source converter - Deadbeat control and saturation strategies [J].

Ottersten, R ;

Svensson, J .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 2002, 17 (02) :279-285

[7]

Saccomando G, 2001, IEEE IND APPLIC SOC, P2419, DOI 10.1109/IAS.2001.955960

[8]

Sarmiento H. G., 1996, IEEE Industry Applications Magazine, V2, P16, DOI 10.1109/2943.476593

[9]

Strangas E. G., 1998, IEEE Industry Applications Magazine, V4, P53, DOI 10.1109/2943.644887

[10]

Suh YS, 2002, IEEE IND APPLIC SOC, P1189, DOI 10.1109/IAS.2002.1042709

← 1 2 →