Atomic force microscopy and Fourier transform infra-red studies of the influence of a highly oriented poly(tetrafluoroethylene) substrate on poly(ethylene terephthalate) overlayers

被引：7

作者：

Hayes, NW ^{[1
]}

Beamson, G ^{[1
]}

Clark, DT ^{[1
]}

Clarke, DT ^{[1
]}

Law, DSL ^{[1
]}

机构：

[1] DARESBURY LAB,BIOL SPECT & IMAGING GRP,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

来源：

POLYMER | 1996年 / 37卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

atomic force microscopy; ir spectroscopy; PET films;

D O I：

10.1016/0032-3861(96)82925-9

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Atomic force microscopy (AFM) and Fourier transform infra-red spectroscopy (FT i.r.) were used to investigate the nature of poly(ethylene terephthalate) (PET) films formed on the surface of a highly oriented poly(tetrafluoroethylene) (PTFE) substrate mechanically deposited on silicon wafers. PTFE films have been previously shown to be highly effective substrates for the growth of oriented overlayers; such materials often have unique properties. In this study we report FT i.r. observations of an increase in crystallinity of a PET film formed on such an oriented substrate when compared to a film formed on the untreated silicon wafer. AFM imaging is used to show the deeply contrasting surface of the PET film formed on each substrate.

引用

页码：523 / 526

页数：4

共 17 条

[1]

BEAMSON G, IN PRESS SURFACE INT

[2] SCANNING-TUNNELING-MICROSCOPY STUDY OF ORIENTED POLY(TETRAFLUOROETHYLENE) SUBSTRATES [J].

BODO, P ;

ZIEGLER, C ;

RASMUSSON, JR ;

SALANECK, WR ;

CLARK, DT .

SYNTHETIC METALS, 1993, 55 (01) :329-334

[3]

BOWER DI, 1989, VIB SPECTROSC, P239

[4]

BRYDSON JA, 1982, PLASTICS MATERIALS, P649

[5] APPLICATION OF FOURIER-TRANSFORM INFRARED SPECTROSCOPY TO STUDY OF SEMICRYSTALLINE POLYMERS - POLY(ETHYLENE-TEREPHTHALATE) [J].

DESPOSITO, L ;

KOENIG, JL .

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 1976, 14 (10) :1731-1741

[6] MOLECULAR-STRUCTURE AND THICKNESS OF HIGHLY ORIENTED POLY(TETRAFLUOROETHYLENE) FILMS MEASURED BY ATOMIC FORCE MICROSCOPY [J].

DIETZ, P ;

HANSMA, PK ;

IHN, KJ ;

MOTAMEDI, F ;

SMITH, P .

JOURNAL OF MATERIALS SCIENCE, 1993, 28 (05) :1372-1376

[7] CRYSTALLINITY IN POLY(ETHYLENE TEREPHTHALATE) - A COMPARISON OF X-RAY, INFRA-RED AND DENSITY MEASUREMENTS [J].

FARROW, G ;

WARD, IM .

POLYMER, 1960, 1 (03) :330-339

[8] HIGHLY ORIENTED POLY(DI-N-ALKYLSILYLENE) FILMS ON ORIENTED PTFE SUBSTRATES [J].

FREY, H ;

SHEIKO, S ;

MOLLER, M ;

WITTMANN, JC ;

LOTZ, B .

ADVANCED MATERIALS, 1993, 5 (12) :917-919

[9] MOLECULAR RESOLUTION OF THIN, HIGHLY ORIENTED POLY(TETRAFLUOROETHYLENE) FILMS WITH THE ATOMIC FORCE MICROSCOPE [J].

HANSMA, H ;

MOTAMEDI, F ;

SMITH, P ;

HANSMA, P ;

WITTMAN, JC .

POLYMER, 1992, 33 (03) :647-649

[10] SPECTROSCOPIC CHARACTERIZATION OF THE ROTATIONAL CONFORMATIONS IN THE DISORDERED PHASE OF POLY(ETHYLENE-TEREPHTHALATE) [J].

LIN, SB ;

KOENIG, JL .

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 1982, 20 (12) :2277-2295

← 1 2 →