Monolayer X-ray reflectometry at the air-water interface

被引:18
作者
Yamaoka, H [1 ]
Matsuoka, H [1 ]
Kago, K [1 ]
Endo, H [1 ]
Eckelt, J [1 ]
Yoshitome, R [1 ]
机构
[1] Kyoto Univ, Dept Polymer Chem, Kyoto 6068501, Japan
关键词
D O I
10.1016/S0009-2614(98)00964-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
X-ray reflectometry (XR) of the air-liquid interface has been restricted because of instrumental limitations. We have newly constructed a high-performance XR apparatus which can accommodate a Langmuir-Blodgett trough for air-water interface study. Since this apparatus has a large dynamic range, XR measurements can be performed for monolayers on a water surface at controlled surface pressure. The XR profiles for the lipids distearoylphosphatidylcholine (DSPC) and dibehenoylphosphatidylcholine showed clear Kiessig fringes. The total thickness of the DSPC monolayer changed from 25.5 to 27.1 Angstrom with increasing surface pressure from 10 to 40 mN/m. A systematic XR study for monolayers on water surfaces is possible with this instrument. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:245 / 248
页数:4
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