Roll-to-roll pulsed dc magnetron sputtering deposition of WO3 for electrochromic windows

被引:57
作者
Brigouleix, C
Topart, P
Bruneton, E
Sabary, F
Nouhaut, G
Campet, G
机构
[1] CEA, Ctr Ripault, F-37260 Monts, France
[2] Univ Bordeaux 1, ICMCB, F-33608 Pessac, France
关键词
pulsed dc; reactive sputtering; flexible substrate; electrochromism; tungsten oxide;
D O I
10.1016/S0013-4686(01)00362-0
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This paper reports on the deposition conditions and properties of WO, films used as electrochromic layer in a monolithic device on a plastic substrate. The deposition technique employed was roll-to-roll pulsed de magnetron sputtering. The oxide was deposited at room temperature in an argon and oxygen plasma on a transparent conducting ITO layer previously coated on a PET film. The influence of deposition parameters such as purse mode, total pressure and oxygen partial pressure has been investigated, in order to obtain the best compromise between a high deposition rate and adequate electro-optical properties. As expected, the deposition rate increases with decreasing total pressure and oxygen partial pressure. To control the coloring/bleaching behavior, lithium ions from an aprotic electrolyte have been intercalated in films. Films with thickness around 400 nm exhibit a contrast ratio of 9:1. The optical efficiency increases slightly with increasing total pressure and lies between 30-40 cm(2) C-1. Further, the coloring and bleaching time decreases with increasing total pressure, coloring being faster than bleaching. This is consistent with UV-Vis ellipsometric measurements which reveal that the refractive index decreases with increasing total pressure. TEM investigations also confirm that films deposited at low total pressure exhibit a dense structure whereas those deposited at high-pressure exhibit a columnar structure. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1931 / 1936
页数:6
相关论文
共 18 条
[1]   Comparison between electrochromic and photochromic coloration efficiency of tungsten oxide thin films [J].
Bechinger, C ;
Burdis, MS ;
Zhang, JG .
SOLID STATE COMMUNICATIONS, 1997, 101 (10) :753-756
[2]  
BETEILLE F, 1999, P SOC PHOTOOPT INSTR, V70, P3788
[3]  
BURDIS M, 1995, P SOC PHOTOOPT INSTR, V11, P2531
[4]   OBSERVATION OF NONIDEAL LITHIUM INSERTION INTO SPUTTERED THIN-FILMS OF TUNGSTEN-OXIDE [J].
BURDIS, MS ;
SIDDLE, JR .
THIN SOLID FILMS, 1994, 237 (1-2) :320-325
[5]   A comparison of the electrochemical properties of lithium intercalated amorphous and crystalline tungsten oxide [J].
Gavanier, B ;
Butt, NS ;
Hutchins, M ;
Mercier, V ;
Topping, AJ ;
Owen, JR .
ELECTROCHIMICA ACTA, 1999, 44 (18) :3251-3258
[6]  
Granqvist CG, 1995, HDB INORGANIC ELECTR, P13
[7]  
GRANQVIST CG, 1995, HDB INORGANIC ELECTR, P57
[8]  
JONSSON LB, 2000, THIN SOLID FILMS, V43, P365
[9]  
Lippens P, 1994, P 3N ANN TECH C SOC, P254
[10]  
MAKI SP, 1996, P 39 SOC VAC COAT C, P348