Three-dimensional characterisation of a two-dimensional photonic bandgap reflector at midinfrared wavelengths

被引:15
作者
Rowson, S [1 ]
Chelnokov, A [1 ]
Cuisin, C [1 ]
Lourtioz, JM [1 ]
机构
[1] Univ Paris Sud, Inst Electron Fondamentale, CNRS, URA 022, F-91405 Orsay, France
来源
IEE PROCEEDINGS-OPTOELECTRONICS | 1998年 / 145卷 / 06期
关键词
reflection spectra; photonic bandgap structures; midinfrared wavelengths;
D O I
10.1049/ip-opt:19982470
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A combined experimental and theoretical study is presented of the reflection properties of a two-dimensional photonic crystal in a three-dimensional optical environment. The crystal is a triangular lattice of cylindrical holes in bulk silicon. The reflection spectra are measured over a wide range of midinfrared wavelengths by using a Fourier-transform spectrometer with a convergent incident beam. Very high reflection coefficients are demonstrated for the first-order forbidden bands, reaching 98% for the first band (lambda approximate to 6-8 mu m) in TE polarisation following Gamma-M direction. This result is of great promise for future applications of photonic bandgap reflectors in the midinfrared. From the comparison between the results of characterisation and those of numerical simulations? the contributions of the different effects that degrade the reflector performances are separated. The incident-beam divergence is shown to modify the shapes, widths and positions of the higher-order forbidden bands. Diffraction losses at the interface are found to be strongly dependent on the crystal termination and orientation, and can reach 60%, but only for the smallest wavelengths investigated. In turn, the fabrication inhomogeneities such as the small roughness of the interface or the hole-radius dispersion are shown to be the prime cause of degradation as lone as diffraction effects remain weak.
引用
收藏
页码:403 / 408
页数:6
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