Preparation and femtosecond non-linear optical properties of Ag/SiO2 composite thin films

被引:5
作者
Tanahashi, I
Inouye, H
Mito, A
机构
[1] Osaka Inst Technol, Fac Engn, Dept Appl Chem, Asahi Ku, Osaka 5358585, Japan
[2] Nara Inst Sci & Technol, Grad Sch Mat Sci, Nara 6300101, Japan
[3] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058563, Japan
关键词
optical non-linearity; thin film; Ag particle;
D O I
10.1163/156856703322601924
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Ag nanoparticles embedded in SiO2 thin films (Ag/SiO2 films) were prepared by a multitarget sputtering method. In the optical absorption spectra of the Ag/SiO2 films, the absorption peak due to the surface plasmon resonance (SPR) of Ag particle was clearly observed at the wavelength of 394-413 nm. The imaginary part of the third-order non-linear susceptibility, Im[chi((3))], of the Ag/SiO2 film was estimated to be -1.1 x 10(-8) esu measured by the femtosecond Z-scan technique near the SPR peak. The response time of the film measured from the decay of the differential transmission of the pump-probe experiment was 1.3 ps at the SPR peak.
引用
收藏
页码:939 / 946
页数:8
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