Spectral polarization signatures of materials in the LWIR

被引：4

作者：

Fetrow, MP ^{[1
]}

Sposato, SH ^{[1
]}

Bishop, KP ^{[1
]}

Caudill, TR ^{[1
]}

机构：

[1] USAF, Res Lab, Kirtland AFB, NM 87117 USA

来源：

POLARIZATION ANALYSIS, MEASUREMENT, AND REMOTE SENSING III | 2000年 / 4133卷

关键词：

infrared polarization; polarization signatures;

D O I：

10.1117/12.406633

中图分类号：

TP7 [遥感技术];

学科分类号：

081102 ; 0816 ; 081602 ; 083002 ; 1404 ;

摘要：

The emitted polarization signature of materials is of interest for use in discriminating targets from cluttered backgrounds. In addition, spectrally varying polarization signatures might be used for material identification or to separate target and environment radiance contributions. A spectrally filtered LWIR Imaging Polarimeter (LIP) has been constructed and used in the lab and in the field to make signature measurements of controlled targets; In addition, a full-stokes FTIR Polarization Spectrometer (FSP) has been constructed for higher spectral resolution measurements of materials. This paper will discuss the instruments, calibration methods, general operation, and results characterizing the emitted polarization properties of materials as a function of wavelength.

引用

页码：249 / 260

页数：12

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