Optical and structural analysis of Eu3+-doped alumina planar waveguides elaborated by the sol-gel process

被引:48
作者
Pillonnet-Minardi, A
Marty, O
Bovier, C
Garapon, C
Mugnier, J
机构
[1] Univ Lyon 1, Lab Physicochim Mat Luminescents, CNRS, UMR 5620, F-69622 Villeurbanne, France
[2] Lab Electron Nanotechnol, Capteurs, France
[3] Univ Lyon 1, Dept Phys Mat, CNRS, UMR 5586, F-69622 Villeurbanne, France
关键词
alumina; waveguide; sol-gel; Eu3+;
D O I
10.1016/S0925-3467(00)00053-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Eu3+ ion-doped Al2O3 waveguiding thin films were dip-coated by the sol-gel route. Crack-free films were obtained, about 880 nm thick for 15 layers. According to the results of grazing incidence X-ray diffraction analysis and transmission electron microscopy (TEM), the film contains gamma -Al2O3 nanocrystals in an amorphous surrounding. The refractive index determined by m-lines spectroscopy is 1.582 at 543.7 nm. A good agreement between film thicknesses determined by m-lines spectroscopy measurements and TEM observation is obtained. The propagation is good (propagation losses less than 2 dB/cm) and waveguide fluorescence spectroscopy (WFS) could be used to register the Eu3+ fluorescence spectrum, which shows disordered environment for Eu3+ ions. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:9 / 13
页数:5
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