A generalised shock model for software reliability

被引：6

作者：

Chatterjee, S

Misra, RB

Alam, SS ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Math, Kharagpur 721302, W Bengal, India

[2] Indian Inst Technol, Dept Elect Engn, Kharagpur 721302, W Bengal, India

来源：

COMPUTERS & ELECTRICAL ENGINEERING | 1998年 / 24卷 / 05期

关键词：

software reliability; shock model; imperfect debugging; failure intensity;

D O I：

10.1016/S0045-7906(98)00005-6

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a generalised shock model for software reliability has been proposed considering test inputs as shocks or repeated stress and the test intensity as a function of time. Also, it is considered here that the inputs for which the software fails during testing are variable quantities. Some veil known software reliability models have been derived from the proposed shock model. (C) 1998 Elsevier Science Ltd. All rights reserved.

引用

页码：363 / 368

页数：6

共 16 条

[1] ASSESSING THE RELIABILITY OF COMPUTER SOFTWARE AND COMPUTER-NETWORKS - AN OPPORTUNITY FOR PARTNERSHIP WITH COMPUTER SCIENTISTS [J].