EPR characterization of O- and trapped electrons in 20% SrF2/SmOF

被引:14
作者
Au, CT [1 ]
Zhou, XP [1 ]
机构
[1] XIAMEN UNIV, DEPT CHEM, XIAMEN 361005, PEOPLES R CHINA
来源
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS | 1996年 / 92卷 / 10期
关键词
D O I
10.1039/ft9969201793
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An X-ray diffraction study of the 20% SrF2/SmOF catalyst has revealed the presence of cubic SrF2 and rhombohedral SmOF crystal phases. The lattice of the SrF2 crystal phase was distorted. Cationic and anionic exchanges may have occurred to cause such deformity. When the 20% SrF2/SmOF sample was treated in helium at 1073 K, EPR signals corresponding to O- centres were observed. Hydrogen or ethane treatment of the sample at 973 K or above resulted in the detection of superhyperfine structures corresponding to the presence of trapped electrons. No similar EPR signals were observed on the SmOF sample. We suggest that these EPR-detectable species were located in the SrF2 lattice and existed largely in the bulk. The trapped electrons were stable in oxygen up to 673 K while O- centres were stable in ethane or hydrogen up to a temperature as high as 873 K. We speculate that the migration of O- centres and trapped electrons is more arduous in fluoride than in oxide. Hence the temperature for the combination of O- centres and trapped electrons as well as for the migration of O- centres and trapped electrons from the bulk towards the surface is higher in the former than in the latter.
引用
收藏
页码:1793 / 1798
页数:6
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